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EETOP 创芯网论坛 (原名：电子顶级开发网)»论坛 › IC 设计及制造（半导体、微电子）› IC测试与可测性› 资料区
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资料区 今日: 0|主题: 813|排名: 198 

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motolola内部的design for test_TestBasics_Class  ...23456 zhongshanli 2008-10-13 5714907 慕之少艾 2024-12-26 16:58
Morgan ClayPool : an introduction to logic circuit testing  ...2 xudeqiang 2009-2-26 124578 igolaps 2024-12-26 15:03
Scan原理介绍(Soft Test),english version  ...23456..8 liuyunwujia 2009-5-4 7721676 leon_strive 2024-12-26 14:52
Softtest Funtional Test  ...2 henrygao 2008-9-11 175552 leon_strive 2024-12-26 14:30
[资料] Test Pattern Validation User Guide  ...234 staric 2010-12-3 3213501 leon_strive 2024-12-26 14:21
[资料] EDA for IC System Design Verification and Testing（英文版）  ...234 lgy607 2010-12-1 308168 leon_strive 2024-12-26 11:20
Essentials of Electronic Testing for Digital Memory  ...23456..8 fong1212 2007-11-9 7820135 leon_strive 2024-12-26 10:46
[资料] RF Microelectronics [Behzad Razavi] zhimigan 2022-1-5 71998 leon_strive 2024-12-26 10:45
ic测试书籍7件套之1  ...234 zhongshanli 2008-10-13 3811783 leon_strive 2024-12-26 10:08
A test article  ...2 ihlin0733 2009-6-27 115036 leon_strive 2024-12-25 17:23
[资料] 不错的资料，集成电路面试必备之关于关于Memory Modeling  ...23 nano_dv 2018-1-19 227057 xj0ipk 2024-12-25 16:49
[资料] Design, Automation, and Test in Europe-10 years 陆地巡洋舰 2019-3-22 92462 leon_strive 2024-12-25 14:02
Essentials of electronic testing-digital memory，mixed-signal VLSI)  ...23456..8 qq098 2008-4-13 7220888 leon_strive 2024-12-25 13:59
[资料] ISO-26262 新人帖 xylcool5 2022-3-26 42111 leon_strive 2024-12-25 13:57
[资料] 集成电路面试必备之关于测试覆盖率  ...2345 nano_dv 2018-1-5 4710900 250740247 2024-12-25 10:40
[资料] 93K应用手册 - [阅读权限 255]  ...2 bm57145974 2024-8-16 131618 250740247 2024-12-25 10:38
[资料] 三个DFT资料  ...23456..7 nbuzs 2009-12-17 6116753 250740247 2024-12-25 10:33
[资料] Books--Arithmetic Built-in Self-Test for Embedded Systems  ...2 一岁就很帅 2019-3-28 134548 leon_strive 2024-12-25 09:55
[资料] VLSI测试与可测试性设计的课件 新人帖  ...23 Diannee 2021-7-15 256086 leon_strive 2024-12-25 09:52
[资料] Scan Chain Design  ...2345 gangersun 2011-8-19 4113783 leon_strive 2024-12-25 09:50
基于ATE的IC测试原理 方法及故障分析  ...23456 zweishi 2008-8-21 5214095 leon_strive 2024-12-25 09:49
IC测试原理解析  ...2345 tigerxixi 2009-11-12 4611388 leon_strive 2024-12-25 09:46
[资料] 高速数字信号的眼图和抖动/噪声测量技术-keysight  ...23456 不懂也不问 2019-1-24 5510111 leon_strive 2024-12-25 09:45
[资料] VLSI Circuit Design Methodology Demystified - A Conceptual Taxonomy  ...2 zhimigan 2022-1-7 143781 leon_strive 2024-12-25 09:45
Production Testing of RF and Soc  ...2345 the_4400 2009-7-2 4010616 leon_strive 2024-12-25 09:43
[资料] mbist理论知识  ...23456..17 ys82 2011-2-23 16038235 leon_strive 2024-12-24 22:20
[资料] CIC 2011 V93K 数字IC测试lab  ...234 lingqinzi 2012-4-29 3511462 leon_strive 2024-12-24 22:08
[资料] DFT & ATPG  ...23456..21 gangersun 2011-8-24 20451256 leon_strive 2024-12-23 16:55
[资料] Fundamental Of Testing On ATE  ...234 zhimigan 2022-1-7 305710 leon_strive 2024-12-23 16:30
DFT全部官方资料  ...23456..16 cdchen 2009-10-27 15230190 leon_strive 2024-12-23 10:42
[资料] 分享一本松本行弘的书 编程语言的设计与实现 松本行弘  ...2 dreamfly123123 2023-5-18 122378 leon_strive 2024-12-23 10:41
[资料] Test Generation of Crosstalk Delay Faults in VLSI Circuits @2018  ...2 2046 2022-10-31 132362 jimcmwang 2024-12-22 22:54
[资料] Contactless VLSI Measurement and Testing Techniques @2018  ...2 2046 2022-10-24 122512 jimcmwang 2024-12-22 22:48
[资料] High-Performance_Low-Power_Cache_Memory_Architectures  ...2 zhimigan 2022-1-7 143318 jimcmwang 2024-12-22 22:45
[资料] Multi-run Memory Tests for Pattern Sensitive Faults  ...2 dongcy 2022-3-22 143469 jimcmwang 2024-12-22 22:44
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