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EETOP 创芯网论坛 (原名：电子顶级开发网)»论坛 › IC 设计及制造（半导体、微电子）› IC测试与可测性› 资料区
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资料区 今日: 0|主题: 805|排名: 198 

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[资料] stanford-Chip Test and Debug Seminar  ...2 kanbin 2010-9-17 154968 leon_strive 2024-12-26 17:37
[资料] [IC测试标准]温度循环测试  ...2 free2bird 2010-8-1 135262 leon_strive 2024-12-26 17:36
[原创] Electronic Test Instruments Analog and Digital Measurements 2nd [Witte R.A]  ...2 tmd007 2023-5-25 112357 opqfeixue122 2024-12-26 17:09
[资料] hight frequency at speed test 陆地巡洋舰 2019-3-22 31982 慕之少艾 2024-12-26 16:59
motolola内部的design for test_TestBasics_Class  ...23456 zhongshanli 2008-10-13 5714178 慕之少艾 2024-12-26 16:58
Morgan ClayPool : an introduction to logic circuit testing  ...2 xudeqiang 2009-2-26 124386 igolaps 2024-12-26 15:03
Scan原理介绍(Soft Test),english version  ...23456..8 liuyunwujia 2009-5-4 7720751 leon_strive 2024-12-26 14:52
Softtest Funtional Test  ...2 henrygao 2008-9-11 175311 leon_strive 2024-12-26 14:30
[资料] Test Pattern Validation User Guide  ...234 staric 2010-12-3 3212970 leon_strive 2024-12-26 14:21
[资料] EDA for IC System Design Verification and Testing（英文版）  ...234 lgy607 2010-12-1 307600 leon_strive 2024-12-26 11:20
Essentials of Electronic Testing for Digital Memory  ...23456..8 fong1212 2007-11-9 7819304 leon_strive 2024-12-26 10:46
[资料] RF Microelectronics [Behzad Razavi] zhimigan 2022-1-5 71817 leon_strive 2024-12-26 10:45
ic测试书籍7件套之1  ...234 zhongshanli 2008-10-13 3811217 leon_strive 2024-12-26 10:08
[原创] 个人找ATE兼职，可以做的平台有93K，UF,UFP,J750 LXRN 2024-12-26 0288 LXRN 2024-12-26 09:31
A test article  ...2 ihlin0733 2009-6-27 114815 leon_strive 2024-12-25 17:23
[资料] 不错的资料，集成电路面试必备之关于关于Memory Modeling  ...23 nano_dv 2018-1-19 226503 xj0ipk 2024-12-25 16:49
[资料] Design, Automation, and Test in Europe-10 years 陆地巡洋舰 2019-3-22 92300 leon_strive 2024-12-25 14:02
Essentials of electronic testing-digital memory，mixed-signal VLSI)  ...23456..8 qq098 2008-4-13 7220027 leon_strive 2024-12-25 13:59
[资料] ISO-26262 新人帖 xylcool5 2022-3-26 41959 leon_strive 2024-12-25 13:57
[资料] 集成电路面试必备之关于测试覆盖率  ...2345 nano_dv 2018-1-5 4710199 250740247 2024-12-25 10:40
[资料] 93K应用手册 - [阅读权限 255]  ...2 bm57145974 2024-8-16 131618 250740247 2024-12-25 10:38
[资料] 三个DFT资料  ...23456..7 nbuzs 2009-12-17 6115893 250740247 2024-12-25 10:33
[资料] Books--Arithmetic Built-in Self-Test for Embedded Systems  ...2 一岁就很帅 2019-3-28 134293 leon_strive 2024-12-25 09:55
[资料] VLSI测试与可测试性设计的课件 新人帖  ...23 Diannee 2021-7-15 255691 leon_strive 2024-12-25 09:52
[资料] Scan Chain Design  ...2345 gangersun 2011-8-19 4113204 leon_strive 2024-12-25 09:50
基于ATE的IC测试原理 方法及故障分析  ...23456 zweishi 2008-8-21 5213452 leon_strive 2024-12-25 09:49
IC测试原理解析  ...2345 tigerxixi 2009-11-12 4610747 leon_strive 2024-12-25 09:46
[资料] 高速数字信号的眼图和抖动/噪声测量技术-keysight  ...23456 不懂也不问 2019-1-24 559437 leon_strive 2024-12-25 09:45
[资料] VLSI Circuit Design Methodology Demystified - A Conceptual Taxonomy  ...2 zhimigan 2022-1-7 143395 leon_strive 2024-12-25 09:45
Production Testing of RF and Soc  ...2345 the_4400 2009-7-2 4010186 leon_strive 2024-12-25 09:43
[资料] mbist理论知识  ...23456..17 ys82 2011-2-23 16036469 leon_strive 2024-12-24 22:20
[资料] CIC 2011 V93K 数字IC测试lab  ...234 lingqinzi 2012-4-29 3510950 leon_strive 2024-12-24 22:08
[资料] DFT & ATPG  ...23456..21 gangersun 2011-8-24 20449162 leon_strive 2024-12-23 16:55
[资料] Fundamental Of Testing On ATE  ...234 zhimigan 2022-1-7 305274 leon_strive 2024-12-23 16:30
DFT全部官方资料  ...23456..16 cdchen 2009-10-27 15228912 leon_strive 2024-12-23 10:42
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