Wafer-level Testing and Test During Burn-in for Integrated Circuits

pxj0557 · 发表于 2017-8-15 17:36:37

学习一下，谢谢分享！！！

辛中臣 · 发表于 2017-8-20 23:31:55

感谢楼主分享

chaojixin · 发表于 2017-9-22 21:06:11

看看！！！！！！！！

chaojixin · 发表于 2017-9-22 21:25:13

看一看！！！！！！！！

jimcmwang · 发表于 2018-5-6 00:37:27

2010 Wafer-level Testing and Test During Burn-in for Integrated Circuits.pdf (2.94 MB)

jeanway · 发表于 2018-5-6 15:43:20

good book

tywang7523 · 发表于 2018-5-7 23:47:21

thanks for share

dioporco · 发表于 2018-5-9 04:17:59

interesting

dioporco · 发表于 2018-5-9 04:18:42

thank you

xuyun28 · 发表于 2018-5-10 15:40:18

感谢，收藏了

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[资料] Wafer-level Testing and Test During Burn-in for Integrated Circuits