求助几个资料

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求助几个资料的资源
1.A. J. van de Goor, Testing Semiconductor Memories: Theory and Practice, John Wiley & Sons, Chichester, UK, 1991.
2.P. Mazumder and K. Chakraborty, Testing and Testable Design of High-Density Random-Access Memories, Frontiers in Electronic Testing, Kluwer Academic Publishers, Boston, June 1996,ISBN 0792397827.
3.P. Mazumder and K. Chakraborty, Testing and Testable Design of High-Density Random-Access Memories, Frontiers in Electronic Testing, Kluwer Academic Publishers, Boston, June 1996,ISBN 0792397827.

洛神孤恋

我有第二本

zhang5966180

3错了，是这个：A. J. van de Goor, The Implementation of Pseudorandom Memory Tests on Commercial Memory

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3 是这个
A. J. van de Goor, The Implementation of Pseudorandom Memory Tests on Commercial Memory Testers, in Proceedings of the IEEE International Test Conference, 1997, pp. 226–235.

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洛神孤恋 发表于 2020-10-29 10:39
我有第二本

好的谢谢额