柯明道－overcome latchup failure of a power controller IC

semico_ljj

論文名稱	Failure analysis and solutions to overcome latchup failure event of a power controller IC in bulk CMOS technology

期刊

S.-H. Chen and Ming-Dou Ker, “On-panel output buffer with offset compensation technique for data driver in LTPS technology,”Microelectronics Reliability, vol. 46, no. 7, pp. 1042-1049, Jul. 2006

摘要

Latchup failure which occurred at only one output pin of a power controller IC product is investigated in this work. The special design requirement of the internal circuits causes the parasitic diode that is inherent between the n-well and p-substrate to be a triggering source of the latchup occurrence in this IC. The parasitic diode of the internal PMOS was easily turned on by an anomalous external signal to trigger the neighbor parasitic Silicon Controlled Rectifier (SCR)         path which causes latchup event in the CMOS IC product. Some solutions to overcome this latchup failure have been also proposed in this paper.

elliot_cai

好东西！

yihsinkaku1

奇怪
這篇在台灣的博碩士論文圖書館竟找不到
只能在這裏抓...

rommelhitler

Thanks a lot!

liming7516

好东西！

xiaotanglang

nice paper

langzijian2006

thanks～～～

xp212125o

thank you ~

wangjianping

回复 1# semico_ljj

wangjianping

回复 9# wangjianping