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楼主: dendrite

[高清晰版]VLSI Test Principles and Architectures Design for Testability

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发表于 2015-9-21 23:52:14 | 显示全部楼层
VLSI Test Principles and Architectures
发表于 2015-9-22 22:10:38 | 显示全部楼层
kankan
发表于 2015-9-23 13:12:04 | 显示全部楼层
看一下,看过找不到了。。。
发表于 2015-9-29 22:16:04 | 显示全部楼层
a good book definitely!
发表于 2015-10-1 00:10:19 | 显示全部楼层
谢谢楼主
发表于 2015-11-9 22:44:39 | 显示全部楼层
多谢分享
发表于 2015-11-9 23:32:47 | 显示全部楼层
thanks for your sharing, but it can't reveal the real topic of this book , at least from the title of the book.
发表于 2015-11-17 12:33:44 | 显示全部楼层
VLSI Test Principles and Architectures Design for Testability.part1.rar (4 MB)

VLSI Test Principles and Architectures Design for Testability.part2.rar (812.83 KB)
发表于 2015-11-17 12:35:59 | 显示全部楼层
VLSI Test Principles and Architectures Design for Testability.part1.rar (4 MB)

VLSI Test Principles and Architectures Design for Testability.part2.rar (812.83 KB)
发表于 2015-11-22 21:19:51 | 显示全部楼层
VLSI Test Principles and Architectures Design for Testability.part1.rar (4 MB)

VLSI Test Principles and Architectures Design for Testability.part2.rar (812.83 KB)
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